The Element 2 SF-ICP-MS is the accepted and most powerful technique for the analysis and quantification of trace elements. Its applications range from the semiconductor industry to geological and environmental analyses, from biological research to material sciences. The most severe limitation of ICP-MS are polyatomic interferences on the elemental signals, originating from Argon and/or the sample matrix. High Mass resolution is the gold standard for the identification and elimination of interferences. Elimination of interferences enables accurate and reliable quantitative multi-element analyses at trace levels, even without sample preparation.


Sensitivity: > 1 x 109 cps/ppm for In
Detection Limits: < 1 ppq (theoretical, non-interfered)
Dark Noise: < 0.2 cps
Dynamic Range: > 109 linear

Sensitivity Specification

LowResolution (R = 300) 115In > 1×106 cps/ppb
MediumResolution (R = 4000) 115In > 1×105 cps/ppb
High Resolution (R = 10000) 115In > 1.5×104 cps/ppb
Background in all 3 resolutions < 0.2 cps